Publications de
Ludi Akue, Emmanuel Lavinal, Thierry Desprats, Michelle Sibilla
Generic and Adaptable Online Configuration Verification for Complex Networked Systems
Dans : International Journal on Advances in Systems and Measurements, IARIA, Vol. 7 N. 1&2, p. 168-178, 2014.
Ludi Akue, Emmanuel Lavinal, Thierry Desprats, Michelle Sibilla
Integrating an Online Configuration Checker with Existing Management Systems: Application to CIM/WBEM Environments (regular paper)
Dans : International DMTF Academic Alliance Workshop on Systems and Virtualization Management: Standards and New Technologies (SVM 2013), Zürich, Switzerland, 18/10/13-18/10/13, IEEExplore digital library, p. 339-344, octobre 2013.
Ludi Akue, Emmanuel Lavinal, Thierry Desprats, Michelle Sibilla
Runtime Configuration Validation for Self-configurable Systems (short paper)
Dans : IFIP/IEEE International Symposium on Integrated Network Management (IM 2013), Ghent, Belgium, 27/05/13-31/05/13, IEEE : Institute of Electrical and Electronics Engineers, (support électronique), mai 2013.
Ludi Akue, Emmanuel Lavinal, Michelle Sibilla
A Model-Based Approach to Validate Configurations at Runtime (regular paper)
Dans : The Fourth International Conference on Advances in System Testing and Validation Lifecycle (VALID 2012), Lisbon, Portugal, 18/11/12-23/11/12, Xpert Publishing Service (XPS), p. 133-138, novembre 2012 (Best Papers Award).
Ludi Akue, Emmanuel Lavinal, Michelle Sibilla
A dynamic configuration validation language (short paper)
Dans : Symposium on Configuration Analytics and Automation (SafeConfig 2011), Arlington, VA, USA, 31/10/11-01/11/11, IEEE : Institute of Electrical and Electronics Engineers, (en ligne), décembre 2011.
Accès : http://dx.doi.org/10.1109/SafeConfig.2011.6111670
BibTeXLudi Akue, Emmanuel Lavinal, Michelle Sibilla
Towards a validation framework for dynamic reconfiguration (short paper)
Dans : IEEE/IFIP International Conference on Network and Service Management (CNSM 2010), Niagara Falls, Canada, 25/10/10-29/10/10, IEEE : Institute of Electrical and Electronics Engineers, p. 314-317, octobre 2010.